DocumentCode :
1114436
Title :
Efficient Generation of Statistically Good Pseudonoise by Linearly Interconnected Shift Registers
Author :
Hurd, William J.
Author_Institution :
Communications Systems Research Section, Jet Propulsion Laboratory, California Institute of Technology
Issue :
2
fYear :
1974
Firstpage :
146
Lastpage :
152
Abstract :
Some new algorithms are presented for efficiently generating pseudorandom noise both in hardware and software. In software, a new word of pseudorandom bits can be generated about every 12 machine cycles, and hardware implementations can generate pseudo Gaussian noise with bandwith of 20 MHz or more. The algorithms generate binary maximal-length linear recursive sequencies of high degree and with many nonzero terms. The ability to efficiently implement high-degree recursions is important because the number of consecutive bits which can be guaranteed to be both linearly and statistically independent is equal to the degree of the recursion. The implementations are by interconnection of several short shift registers in a linear manner in such a way that different widely spaced phase shifts of the same p-n sequence appear in the stages of the several registers. Some specific algorithms have been subjected to extensive statistical evaluation, with no evidence found to distinguish the sequences from purely random binary sequences.
Keywords :
Chi-squared tests, Gaussian noise, linear finite state machines, linear recursive sequences, noise generation, primitive polynomials, pseudonoise, random numbers, shift register sequences, statistical tests.; Application software; Clocks; Gaussian noise; Hardware; Noise generators; Pulse generation; Shift registers; Signal generators; Software algorithms; Testing; Chi-squared tests, Gaussian noise, linear finite state machines, linear recursive sequences, noise generation, primitive polynomials, pseudonoise, random numbers, shift register sequences, statistical tests.;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/T-C.1974.223877
Filename :
1672470
Link To Document :
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