DocumentCode
1114441
Title
Characterization of Silver/Polystyrene (PS)-Coated Hollow Glass Waveguides at THz Frequency
Author
Themistos, Christos ; Rahman, B. M Azizur ; Rajarajan, Muttukrishnan ; Grattan, Kenneth T V ; Bowden, B. ; Harrington, J.A.
Author_Institution
City Univ., London
Volume
25
Issue
9
fYear
2007
Firstpage
2456
Lastpage
2462
Abstract
Finite-element analysis based on the full-vectorial H-field formulation has been established as one of the most powerful and accurate modal solution approaches for optical guided-wave devices. Among the available optical waveguides, those incorporating thin metal layers supporting the surface plasmon modes (SPMs) and coupling of these modes to dielectric modes have recently been proven to be attractive for many applications. In this paper, the H-field approach incorporating the perturbation technique is used in calculating the complex propagation characteristics of silver/polystyrene (PS)-coated hollow glass waveguides for terahertz frequency radiation. The propagation and attenuation characteristics of the SPMs at the metal/dielectric interfaces are presented. The formation of the coupled supermodes and the effect of the PS coating thickness on the attenuation characteristics of these waveguides are also investigated and shown to be critical to their design optimization.
Keywords
antireflection coatings; finite element analysis; optical films; optical glass; optical polymers; optical waveguides; silver; surface plasmons; coupled supermodes; dielectric modes; finite-element analysis; full-vectorial H-field formulation; hollow glass waveguides; polystyrene coating; silver coating; surface plasmon modes; Attenuation; Dielectrics; Frequency; Glass; Hollow waveguides; Optical attenuators; Optical devices; Optical waveguides; Scanning probe microscopy; Silver; Finite-element method (FEM); hollow glass waveguides (HGWs); metal-clad dielectric waveguides; modal solutions; surface plasmon modes (SPMs); terahertz (THz) waveguides;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2007.902745
Filename
4299017
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