DocumentCode
1114796
Title
Switching characteristics of scaled CMOS circuits at 77 K
Author
Huang, J.S.T. ; Schrankler, Jay W.
Author_Institution
Honeywell, Inc., Plymouth, MN
Volume
34
Issue
1
fYear
1987
fDate
1/1/1987 12:00:00 AM
Firstpage
101
Lastpage
106
Abstract
Performance enhancement of CMOS inverters at room and liquid-nitrogen temperatures are studied. The extent of delay improvement at low temperature is limited by the velocity saturation effect, as the channel lengths are decreased and/or the supply voltage increased. An analytical delay model taking into account velocity saturation is developed that accurately predicts the measured delay of CMOS inverter chains with drawn channel lengths down to 0.5 µm, Compared are the relative merits of CMOS devices operating at 77 K and those scaled for room-temperature operations.
Keywords
Analytical models; Delay effects; Inverters; Length measurement; Predictive models; Semiconductor device modeling; Switching circuits; Temperature; Velocity measurement; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1987.22891
Filename
1486602
Link To Document