• DocumentCode
    1114796
  • Title

    Switching characteristics of scaled CMOS circuits at 77 K

  • Author

    Huang, J.S.T. ; Schrankler, Jay W.

  • Author_Institution
    Honeywell, Inc., Plymouth, MN
  • Volume
    34
  • Issue
    1
  • fYear
    1987
  • fDate
    1/1/1987 12:00:00 AM
  • Firstpage
    101
  • Lastpage
    106
  • Abstract
    Performance enhancement of CMOS inverters at room and liquid-nitrogen temperatures are studied. The extent of delay improvement at low temperature is limited by the velocity saturation effect, as the channel lengths are decreased and/or the supply voltage increased. An analytical delay model taking into account velocity saturation is developed that accurately predicts the measured delay of CMOS inverter chains with drawn channel lengths down to 0.5 µm, Compared are the relative merits of CMOS devices operating at 77 K and those scaled for room-temperature operations.
  • Keywords
    Analytical models; Delay effects; Inverters; Length measurement; Predictive models; Semiconductor device modeling; Switching circuits; Temperature; Velocity measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1987.22891
  • Filename
    1486602