DocumentCode :
1115774
Title :
Improved performance of 264 nm emission AIGaN-based deep ultraviolet light-emitting diodes
Author :
Zhu, Y.H. ; Sumiya, S. ; Zhang, J.C. ; Miyoshi, M. ; Shibata, T. ; Kosaka, K. ; Tanaka, M. ; Egawa, T.
Author_Institution :
Nagoya Inst. of Technol., Nagoya
Volume :
44
Issue :
7
fYear :
2008
Firstpage :
493
Lastpage :
495
Abstract :
AlGaN-based multiple-quantum-well light-emitting diodes (LEDs) with peak emission at UV-C region of 264 nm were successfully gown on AlN template using metal organic chemical vapour deposition. It was found that a subband emission around 320 nm can be drastically reduced by inserting a thin 1 nm-thick AlN interlayer between the active region and p-type layers. This is presumably a result of the suppression of electron overflow or Mg diffusion. It was also observed that the output power in LEDs was increased up to more than 20 times by changing the layer construction.
Keywords :
III-V semiconductors; aluminium compounds; chemical vapour deposition; light emitting diodes; AlGaN-based multiple-quantum-well; AlN interlayer; AlN template; Mg diffusion; UV-C region; electron overflow suppression; emission AlGaN-based deep ultraviolet LED; light-emitting diodes; metal organic chemical vapour deposition; p-type layers; peak emission; subband emission;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:20082753
Filename :
4479563
Link To Document :
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