• DocumentCode
    1115902
  • Title

    Bridging and Stuck-At Faults

  • Author

    Mei, Kenyon C Y

  • Author_Institution
    Data Systems Division, Hewlett-Packard
  • Issue
    7
  • fYear
    1974
  • fDate
    7/1/1974 12:00:00 AM
  • Firstpage
    720
  • Lastpage
    727
  • Abstract
    The commonly used stuck-at fault fails to model logic circuit shorts. Bridging faults are defined to model these circuit mal-functions. This model is based on wired logic which is a characteristic of many logic families such as resistor-transistor logic (RTL), diode transistor logic (DTL), emitter-coupled logic (ECL), etc. It does not apply to TTL circuits. The model also limits to fan-out-free leads.
  • Keywords
    Bridging faults, fault detection, fault dominance, fault modeling, shorts.; Bridge circuits; Circuit faults; Circuit testing; Diodes; Electrical fault detection; Fault detection; Lead; Logic circuits; Printed circuits; Wires; Bridging faults, fault detection, fault dominance, fault modeling, shorts.;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/T-C.1974.224020
  • Filename
    1672613
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1115902