DocumentCode :
1116170
Title :
Predicting random jitter - Exploring the current simulation techniques for predicting the noise in oscillator, clock, and timing circuits
Author :
Wedge, Scott W.
Volume :
22
Issue :
6
fYear :
2006
Firstpage :
31
Lastpage :
38
Abstract :
The random jitter performance of clock, oscillator, and timing circuits can be predicted by using steady-state circuit simulation techniques that determine phase noise by analyzing the impact on phase due to thermal, flicker, channel, and shot noise present in the electronic devices. Given the phase noise response, and the steady-state operating conditions of the circuit, a wide variety of jitter measurements can be computed. Each involves a transformation of the phase noise results, with accuracy hinging on the quality of the phase noise response over a suitable range of offset frequencies
Keywords :
circuit noise; clocks; noise measurement; oscillators; phase noise; random noise; timing circuits; timing jitter; clock noise; current simulation techniques; electronic devices; jitter measurements; oscillator noise; phase noise; random jitter; steady-state circuit simulation techniques; timing circuits noise; 1f noise; Circuit noise; Circuit simulation; Clocks; Oscillators; Performance analysis; Phase noise; Predictive models; Steady-state; Timing jitter;
fLanguage :
English
Journal_Title :
Circuits and Devices Magazine, IEEE
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/MCD.2006.307274
Filename :
4099513
Link To Document :
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