DocumentCode
111685
Title
The Optoelectronic Properties of PbS Nanowire Field-Effect Transistors
Author
Seunghyun Lee ; Jin-Seo Noh ; Jeongmin Kim ; MinGin Kim ; So Young Jang ; Jeunghee Park ; Wooyoung Lee
Author_Institution
Dept. of Mater. Sci. & Eng., Yonsei Univ., Seoul, South Korea
Volume
12
Issue
6
fYear
2013
fDate
Nov. 2013
Firstpage
1135
Lastpage
1138
Abstract
We report on the optoelectronic properties of individual PbS nanowires prepared by gas-phase substitution reaction of pregrown CdS nanowires. The PbS nanowires synthesized by this method were found to be single crystals with high quality. A combination of electron-beam lithography and a lift-off process was utilized to fabricate individual 62-nm-thick PbS nanowire field-effect transistors (FETs). The nanowire FETs showed pronounced photoconductivity under light illumination while they were highly resistive in the dark environment. The conductivity increased by more than 40 folds in the presence of light. Our results are the first demonstration of the highly efficient photoresponse of individual single-crystalline PbS nanowires and provide insights into future works on nanostructured PbS optoelectronics.
Keywords
II-VI semiconductors; IV-VI semiconductors; cadmium compounds; electron beam lithography; field effect transistors; lead compounds; nanoelectronics; nanowires; optoelectronic devices; photoconductivity; semiconductor growth; wide band gap semiconductors; CdS; PbS; dark environment; electron-beam lithography; gas-phase substitution reaction; lift-off process; light illumination; nanostructured PbS optoelectronics; nanowire FETs; nanowire field-effect transistors; optoelectronic property; pronounced photoconductivity; single crystals; single-crystalline PbS nanowires; size 62 nm; Field effect transistors; Lighting; Logic gates; Nanowires; Resistance; Temperature measurement; Voltage measurement; Field-effect transistor (FET); PbS nanowires; photoconductivity;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2013.2280911
Filename
6589194
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