Title :
Quantitative Evaluation of the Impact of Repetitive Voltage Sags on Low-Voltage Loads
Author :
Moon, Jong-Fil ; Yun, Sang-Yun ; Kim, Jae-Chul
Author_Institution :
Korea Electr. Eng. & Sci. Res. Inst., Seoul
Abstract :
Automatic reclosing is a typical protection method to clear temporary faults in power distribution systems. However, it has a weakness in regards to voltage sags because it produces repetitive voltage sags. In this paper, we explored the repetitive impacts of voltage sags due to the automatic reclosing of power distribution systems. The actual tests of low voltage loads were carried out for obtaining the susceptibility of voltage sags. The final results of the tests yielded the power acceptability curves of voltage sag, and the curves was transformed the 3-D Computer Business Equipment Manufacturer Association (CBEMA) format. For the quantitative evaluation of the impact of repetitive voltage sags, an assessment formulation using the voltage sag contour was proposed. The proposed formulation was tested by using the voltage sag contour data of IEEE standard and the results of the test. Through the case studies, we verified that the proposed method can be effectively used to evaluate the actual impact of repetitive voltage sags.
Keywords :
power distribution faults; power distribution protection; power supply quality; IEEE standard; low-voltage loads; power distribution faults; quantitative evaluation; voltage sags; Circuit topology; Computer aided manufacturing; Instruments; Low voltage; Moon; Power distribution; Power quality; Power system protection; Testing; Voltage fluctuations; Automatic reclosing; power acceptability curve; power quality; repetitive voltage sags; voltage sag contour;
Journal_Title :
Power Delivery, IEEE Transactions on
DOI :
10.1109/TPWRD.2007.905405