• DocumentCode
    1120822
  • Title

    Transient switching of the parasitic bipolar device of an epitaxial CMOS transistor

  • Author

    Chang, Wen-Hsing ; Rodriguez, M.D.

  • Author_Institution
    IBM Thomas J. Watson Research Center, Yorktown Heights, NY
  • Volume
    8
  • Issue
    6
  • fYear
    1987
  • fDate
    6/1/1987 12:00:00 AM
  • Firstpage
    275
  • Lastpage
    276
  • Abstract
    The turn-on delay time of the vertical parasitic bipolar device of a CMOS transistor after the application of a latch-up triggering signal to forward bias the n+ source junction was studied. We found that the delay time for the device on an epitaxial CMOS transistor is in the order of a few nanoseconds, which is much shorter than that on a nonepitaxial CMOS transistor.
  • Keywords
    CMOS process; CMOS technology; Circuits; Delay effects; Nanoscale devices; Silicon; Substrates; Testing; Transient response; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1987.26628
  • Filename
    1487178