DocumentCode
1120844
Title
Classical Interpretation of Conduction Currents in Crosslinked Polyethylene (XLPE) and a Comparison with Ideal Polyethylene
Author
Heylen, Albert E D ; Postoyalko, Vasil
Author_Institution
Univ. of Leeds, Leeds
Volume
15
Issue
2
fYear
2008
fDate
4/1/2008 12:00:00 AM
Firstpage
342
Lastpage
349
Abstract
Recent experimental conduction current data are numerically analyzed in terms of the established Richardson/Dushman-Schottky (1914) expression for electron emission rates, from a metal cathode, multiplied by the traditional Townsend (1915) derived electron avalanche sizes due to electron-molecule collision ionization in the bulk insulating dielectric for electric fields up to in excess of 1000 MV/m. Agreement between applied theory and experiment limited to 70 MV/m is excellent. Deduced Townsend primary ionization coefficients in ideal, low and high density polyethylene, in solid, liquid and gaseous ethylenes, air, solid Al2O3 and Nb2O5 are shown diagrammatically. From these it is postulated by calculation that 1.5 - 6% of the interelectrode gap distance in practical XLPE is occupied by air filled space rather than by total ideal polyethylene and that this free space is responsible for considerable ionization in the region of 30 MV/m which prevents 1000 MV/m to be attained. Such high dielectric strength should be achievable if in addition a low electron field emitter cathode such as ultra-pure aluminum is used. It is concluded from this and previous work that bonds between atoms/molecules in polymers are as important as the individual discrete particles by themselves in determining dielectric properties.
Keywords
XLPE insulation; aluminium compounds; dielectric materials; electric breakdown; electrical conductivity; electron emission; molecule-electron collisions; niobium compounds; polymers; Al2O3; Nb2O5; Richardson-Dushman-Schottky expression; Townsend derived electron avalanche; bulk insulating dielectric; conduction current; crosslinked polyethylene; electron emission; electron-molecule collision ionization; intrinsic breakdown strength; ionization coefficient; low electron field emitter cathode; metal cathode; Aluminum; Cathodes; Data analysis; Dielectric breakdown; Dielectrics and electrical insulation; Electron emission; Ionization; Niobium; Polyethylene; Solids;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/TDEI.2008.4483451
Filename
4483451
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