Development of Testing Device for Critical Current Measurements for HTS/LTS

Author

Wang, Qiuliang ; Dai, Yinming ; Zhao, Baozhi ; Song, Shousen ; Cao, Zhiqiang ; Chen, Shunzhong ; Zhang, Quan ; Wang, Housheng ; Cheng, Junsheng ; Lei, Yuanzhong ; Ye, Bai ; Li, Xian ; Liu, Jianhua ; Zhao, Shangwu ; Zhang, Hongjie ; Hu, Xinning ; Wang, Chu

Author_Institution

Inst. of Electr. Eng., Chinese Acad. of Sci., Beijing, China

Volume

19

Issue

3

fYear

2009

fDate

6/1/2009 12:00:00 AM

Firstpage

2325

Lastpage

2328

Abstract

For the goal of superconducting magnet applications in the advanced testing device for high temperature superconducting (HTS) wire and sample coils, a wide bore conduction-cooled superconducting magnet with available warm bore of phi 186 mm and center field of 5 T for the background magnetic field applications was designed and fabricated and tested. A sample cryostat with two GM cryocoolers is inserted in the background magnet. The system allows measurements to be performed in a repeatable and reliable fashion. The detailed design, fabrication and thermal analysis are presented in the paper.

Keywords

critical currents; cryostats; electric current measurement; high-temperature superconductors; superconducting coils; superconducting magnets; thermal analysis; GM cryocoolers; HTS-LTS wire; conduction-cooled superconducting magnet; critical current measurements; cryostat; high-temperature superconducting wire; superconducting coils; superconducting magnet; thermal analysis; Conduction-cooled superconducting magnet; HTS test devices; electro-plastic model;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2009.2018415

Filename

5153098