Title :
Novel Process and Temperature-Stable, IDD Sensor for the BIST Design of Embedded Digital, Analog, and Mixed-Signal Circuits
Author :
Liobe, John ; Margala, Martin
Author_Institution :
Univ. of Massachusetts-Lowell, Lowell
Abstract :
This paper proposes a new IDD sensor for built-in self-test (BIST) applications for digital, analog, and mixed-signal circuits. This novel, wide-band, nonintrusive, process and temperature-stable IDD sensor operates up to 230 MHz, which is 2.3X faster than previously proposed designs, and occupies 78.3% less area than another competing design. A BIST utilizing this novel IDD sensor is created and tested on numerous digital circuits, as well as on an op-amp and a mixer, achieving up to 90% fault coverage, while maintaining the performance of the circuit-under-test. The experiments were implemented in 0.18-m TSMC CMOS mixed-signal technology.
Keywords :
CMOS integrated circuits; analogue circuits; built-in self test; circuit testing; design for testability; digital circuits; embedded systems; mixed analogue-digital integrated circuits; TSMC CMOS mixed-signal technology; built-in self-test design; circuit-under-test; design for testability; embedded analog circuit; embedded digital circuit; frequency 230 MHz; mixed-signal circuits; size 0.18 micron; temperature-stable IDD sensor; Built-in self-test; CMOS technology; Circuit faults; Circuit testing; Current measurement; Design for testability; Integrated circuit technology; Leakage current; Sensor phenomena and characterization; Temperature sensors; Built-in self-test (BIST); CMOS mixed-signal circuits; design for testability (DFT); sensor;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2007.904653
