• DocumentCode
    1124032
  • Title

    The commonality of vector generation techniques

  • Author

    Davidson, Scott

  • Author_Institution
    Sun Microsystems
  • Volume
    25
  • Issue
    2
  • fYear
    2008
  • Firstpage
    200
  • Lastpage
    200
  • Abstract
    The value of test compression is that it has allowed us to move along a continuum between the extremes of ATPG and logic BIST, and has enabled us to find the right combination of test size, test coverage, and test time for a given situation. The basic similarity among different DFT techniques should make us feel confident that we are on the right track in our drive for efficient test compression.
  • Keywords
    Automatic test pattern generation; Built-in self-test; Controllability; Drives; Logic testing; Mathematical model; Observability; Project management; Sun; ATPG; full scan; logic BIST; non-fault-directed test; output compression; semi-fault-directed test; test compression; vector generation;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2008.53
  • Filename
    4483827
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1124032