• DocumentCode
    1124359
  • Title

    Evaluation and analytical electron microscopy investigation of a plated aluminum wire for branch circuit applications

  • Author

    Aronstein, Jesse ; Hare, Thomas K.

  • Volume
    11
  • Issue
    2
  • fYear
    1988
  • fDate
    6/1/1988 12:00:00 AM
  • Firstpage
    218
  • Lastpage
    226
  • Abstract
    Using two-wire splices made with twist-on connectors, the connection performance of a plated aluminum wire has been evaluated over five years of operation at low duty-cycle within rated electrical and environmental conditions. Analytical electron microscopy techniques were used to physically and chemically characterize the surface of the connection test wire, a sample exposed in a controlled environmental test chamber, and a freshly stripped sample of the same wire. The test results show that the plated aluminum wire has improved connectability relative to unplated aluminum previously tested, but it is not equivalent to copper wire. Safe long-term performance of plated aluminum wire is not likely to be achieved without improvement in the integrity of the plating and/or the use of corrosion inhibitor
  • Keywords
    aluminium; electric connectors; electron microscopy; environmental testing; Al wire; analytical electron microscopy; branch circuit applications; connectability; connection performance; controlled environmental test chamber; corrosion inhibitor; environmental conditions; long-term performance; low duty-cycle; twist-on connectors; two-wire splices; Aluminum alloys; Cable insulation; Chemical analysis; Circuits; Copper; Corrosion; Electron microscopy; Nickel; Testing; Wire;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.2990
  • Filename
    2990