DocumentCode :
1125152
Title :
A Review of Microstrip T-Resonator Method in Determining the Dielectric Properties of Printed Circuit Board Materials
Author :
Lätti, K.P. ; Kettunen, M. ; Ström, Juha-Pekka ; Silventoinen, P.
Author_Institution :
Lappeenranta Univ. of Technol., Lappeenranta
Volume :
56
Issue :
5
fYear :
2007
Firstpage :
1845
Lastpage :
1850
Abstract :
When designing devices at microwave frequencies, the characteristics of printed circuit board materials have to be well known in order to attain exact functionality. The characterization can be carried out with the microstrip T-resonator test method described in this paper. With the modifications presented by the authors, the microstrip T-resonator method can be applied with improved accuracy to dielectric characterization as well as to temperature dependence measurements of the printed circuit board materials. The results obtained with the microstrip T-resonator method are also compared to the results given by the microstrip ring resonator test method.
Keywords :
dielectric loss measurement; dielectric materials; microstrip resonators; permittivity; permittivity measurement; printed circuits; dielectric constant; dielectric loss measurement; dielectric measurement; dielectric properties; dissipation factor determination; microstrip T-resonator test method; microstrip ring resonator test method; permittivity measurement; printed circuit board materials; temperature dependence measurement; Circuit testing; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Frequency; Loss measurement; Microstrip resonators; Permittivity measurement; Printed circuits; Transmission line measurements; Dielectric measurements; loss measurement; permittivity measurement; transmission line resonator;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2007.903587
Filename :
4303421
Link To Document :
بازگشت