DocumentCode :
1125196
Title :
Analysis of GaInP/AlGaInP compressive strained multiple-quantum-well laser
Author :
Kamiyama, Satoshi ; Uenoyama, Takeshi ; Mannoh, Masaya ; Ban, Yuzaburoh ; Ohnaka, Kiyoshi
Author_Institution :
Central Res. Labs., Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
Volume :
30
Issue :
6
fYear :
1994
fDate :
6/1/1994 12:00:00 AM
Firstpage :
1363
Lastpage :
1369
Abstract :
We have analyzed GaInP/AlGaInP compressive strained MQW lasers, with theoretical calculation and experimental results. Our calculations of TE polarized gain, where the valence subband mixing and the heterobarrier leakage current are taken into account, are in good agreement with the experimental results. When a compressive strain of up to 0.5% is induced in the quantum wells, the density of states near the valence band edge is decreased, due to the reduction of heavy-hole and light-hole subband mixing. At the threshold condition, the compressive strain reduces not only the radiative recombination current, but also the hetero-barrier leakage current. Therefore, the threshold current is reduced, and its temperature dependence is found to be small, In the analysis, we also show that when larger compressive strain of more than 0.5% is induced in the 40-Å-thick quantum wells, the threshold characteristics are degraded
Keywords :
III-V semiconductors; aluminium compounds; band structure of crystalline semiconductors and insulators; gallium compounds; indium compounds; internal stresses; semiconductor lasers; valence bands; GaInP-AlGaInP; GaInP/AlGaInP compressive strained multiple-quantum-well laser; compressive strain; experimental results; heavy-hole subband mixing; heterobarrier leakage current; light-hole subband mixing; radiative recombination current; temperature dependence; theoretical calculation; threshold condition; threshold current; transverse electric polarized gain; valence band edge; valence subband mixing; Capacitive sensors; Laser theory; Leakage current; Polarization; Quantum well devices; Quantum well lasers; Radiative recombination; Tellurium; Temperature dependence; Threshold current;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.299458
Filename :
299458
Link To Document :
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