• DocumentCode
    1126513
  • Title

    Projections of GaAs solar-cell performance limits based on two-dimensional numerical simulation

  • Author

    Demoulin, Paul D. ; Lundstrom, Mark S.

  • Author_Institution
    Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    36
  • Issue
    5
  • fYear
    1989
  • fDate
    5/1/1989 12:00:00 AM
  • Firstpage
    897
  • Lastpage
    905
  • Abstract
    The development of a comprehensive, two-dimensional numerical model for AlGaAs/GaAs solar cells is described. The model was used to identify loss mechanisms in present-day high-efficiency GaAs cells and to make realistic projections of attainable cell efficiencies. Numerical simulations show that achievable efficiencies of conventional heteroface cells made on high-quality GaAs films exceed 30% under 500 suns (AM1.5 direct spectrum). Both p-n and n-p cells are adversely affected by bandgap narrowing in p+ GaAs. For n-p cells, the use of heterojunction back-surface fields is advantageous and results in an increase of about 1.5% in efficiency. When the Shockley-Read-Hall lifetime parameters are set to infinity, the efficiency increases by only another 0.7%, which demonstrates that bulk material quality is not the major limiting factor in present-day cells. These efficiency projections, which are based on detailed device simulation and realistic material parameters, are only a few percentage points below the thermodynamic limit for GaAs cells
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; semiconductor device models; solar cells; 30 percent; AM1.5 direct spectrum; AlGaAs-GaAs solar cells; Shockley-Read-Hall lifetime parameters; bandgap narrowing; cell efficiencies; heterojunction back-surface fields; loss mechanisms; model; n-p cells; p-n cells; solar-cell performance limits; thermodynamic limit; two-dimensional numerical simulation; Equations; Gallium arsenide; Heterojunctions; Numerical models; Numerical simulation; Photonic band gap; Photovoltaic cells; Semiconductor process modeling; Silicon; Sun;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.299671
  • Filename
    299671