Infrared microscopy study of anomalous latchup characteristics due to current redistribution in different parasitic paths

Author

Canali, Claudio ; Corsi, Francesco ; Muschitiello, Michele ; Zanoni, Enrico

Author_Institution

Dept. of Electron. & Inf., Padova Univ., Italy

Volume

36

Issue

5

fYear

1989

fDate

5/1/1989 12:00:00 AM

Firstpage

969

Lastpage

978

Abstract

Anomalous effects such as abrupt variations of the latchup current in steady-state conditions and window effects, i.e. the existence of a well-defined interval of I/O injected currents for latchup to occur, can occur during pulsed latchup tests. Infrared microscopy allows the correlation of electrical characteristics with latchup current distribution and reveals that anomalous effects are due to the dynamic competition between different latchup paths. This is confirmed by a SPICE simulation of the lumped equivalent circuit of a CMOS output comprising two coupled p-n-p-n parasitic structures

Keywords

CMOS integrated circuits; current distribution; integrated circuit testing; optical microscopy; CMOS output; I/O injected currents; IR microscopy; SPICE simulation; anomalous latchup characteristics; coupled p-n-p-n parasitic structures; current redistribution; electrical characteristics; lumped equivalent circuit; parasitic paths; pulsed latchup tests; window effects; Circuit simulation; Circuit testing; Coupling circuits; Current distribution; Integrated circuit testing; Irrigation; Pulse circuits; SPICE; Scanning electron microscopy; Steady-state;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/16.299680

Filename

299680