A Novel Method to Measure the Internal Quantum Efficiency and Optical Loss of Laser Diodes

Author

Wang, Y. ; Gong, Q. ; Cao, C.F. ; Cheng, R.H. ; Yan, J.Y. ; Yue, L. ; Li, Y.Y. ; Li, A.Z. ; Wang, S.M. ; Cui, J. ; Xu, H.X. ; Wang, H.L. ; Li, S.G.

Author_Institution

State Key Lab. of Functional Mater. for Inf., Shanghai Inst. of Microsyst. & Inf. Technol., Shanghai, China

Volume

27

Issue

11

fYear

2015

fDate

June1, 1 2015

Firstpage

1169

Lastpage

1172

Abstract

We present a novel method to characterize the internal quantum efficiency and internal optical loss of semiconductor lasers. Its basic concept is studying the dependence of the external quantum efficiency on the mirror reflectivity. This method is very different from the conventional one, which focuses on the external quantum efficiency as a function of cavity length. Our method has great advantages, such as the capability of measuring the internal quantum efficiency and optical loss of a single laser diode, which is intrinsically impossible by the conventional method.

Keywords

laser beams; laser cavity resonators; laser mirrors; laser variables measurement; optical losses; reflectivity; semiconductor lasers; cavity length; conventional method; external quantum efficiency; internal optical loss; internal quantum efficiency; mirror reflectivity; semiconductor lasers; single laser diode; Cavity resonators; Optical losses; Optical reflection; Optical scattering; Optical variables measurement; Reflectivity; Semiconductor lasers; Internal quantum efficiency; internal optical loss; semiconductor lasers;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2015.2413991

Filename

7066945