• DocumentCode
    1126930
  • Title

    Phase-Noise Improvement of GaAs pHEMT K-Band Voltage-Controlled Oscillator Using Tunable Field-Plate Voltage Technology

  • Author

    Chiu, Hsien-Chin ; Wei, Chien-Cheng ; Cheng, Chia-Shih ; Wu, Yu-Fei

  • Author_Institution
    Chang Gung Univ., Taoyuan
  • Volume
    29
  • Issue
    5
  • fYear
    2008
  • fDate
    5/1/2008 12:00:00 AM
  • Firstpage
    426
  • Lastpage
    429
  • Abstract
    This letter presents a voltage-controlled oscillator (VCO) with low phase-noise performance by applying tunable field-plate (FP) voltage on 0.15-mum-gate-length GaAs pseudomorphic high-electron-mobility transistors (pHEMTs). In this letter, the FP metal between gate and drain terminals was connected to a single pad and was controlled by an extra voltage supplier (VFP). Owing to the depth modulation of FP-induced depletion region at various FP voltages, the device flicker noise was also improved by applying negative VFP. This technique is convenient to be applied in standard pHEMT fabrication and particularly attractive for reducing the phase noise of VCO design without extra power consumption. A tunable phase-noise inductor-capacitor feedback 21-GHz VCO was demonstrated. The measured phase noise of this novel design is -95 dBc/Hz at an offset frequency of 1 MHz, and this value can be improved to -99.6 dBc/Hz at VFP of -5.5 V. The core dc-power consumption of this circuit is 30.8 mW.
  • Keywords
    high electron mobility transistors; phase noise; voltage-controlled oscillators; GaAs; K-band voltage-controlled oscillator; frequency 1 MHz; frequency 21 GHz; high electron mobility transistors; phase-noise improvement; power 30.8 mW; pseudomorphic HEMT; size 0.15 mum; tunable field-plate voltage; tunable phase-noise inductor-capacitor feedback; voltage -5.5 V; Field-plate (FP); flicker noise; phase noise; pseudomorphic high-electron-mobility transistor (pHEMT); voltage-controlled oscillator (VCO);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2008.920150
  • Filename
    4485009