DocumentCode :
1127766
Title :
A Novel Statistical Method for Automatically Partitioning Tools According to Engineers´ Tolerance Control in Process Improvement
Author :
Tu, Kevin Kai-Wen ; Lee, Jack Chao-Sheng ; Lu, Henry Horng-Shing
Author_Institution :
Macronix Int. Co., Ltd., Hsinchu, Taiwan
Volume :
22
Issue :
3
fYear :
2009
Firstpage :
373
Lastpage :
380
Abstract :
In the semiconductor industry, tool comparison is a key task in yield or product quality enhancements. We develop a new method to automatically partition tools. The new method is called tolerance control partitioning (TCP). The advantages of TCP include 1) taking into account of unbalanced tool usage in manufacturing processes; 2) further partitioning these tools into several homogenous groups by related metrology results instead of detecting only the significant difference; and 3) partitioning these tools according to engineers´ tolerance controls to avoid too many groups with small differences. TCP also could be applied in all similar cases such as experimental recipe or material comparisons. Therefore, using TCP, engineers could speed up yield or product quality ramping.
Keywords :
manufacturing processes; production control; production engineering; quality control; semiconductor industry; statistical analysis; tolerance analysis; manufacturing processes; product quality; semiconductor industry; statistical method; tolerance control partitioning; unbalanced tool usage; yield quality; $C_{pk}$; $C_{p}$; APC; Bayesian fit; CART; data mining; process capability; reversible jump Markov chain Monte Carlo; yield enhancement;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/TSM.2009.2025812
Filename :
5159414
Link To Document :
بازگشت