DocumentCode :
1127797
Title :
A practical look at ATPG
Author :
Davidson, Scott
Author_Institution :
Sun Microsystems
Volume :
21
Issue :
5
fYear :
2004
Firstpage :
448
Lastpage :
449
Abstract :
Book Reviewed: Digital Logic Testing and Simulation, 2nd edition, by Alexander Miczo (Wiley-Interscience, 2003, ISBN 0-471-43995-9, 696 pp., $115).
Keywords :
Automatic test pattern generation; Books; Built-in self-test; Computational modeling; Computer simulation; Delay; Logic testing; Sections; Sun; Test pattern generators;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2004.44
Filename :
1341385
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1127797
