DocumentCode
1127797
Title
A practical look at ATPG
Author
Davidson, Scott
Author_Institution
Sun Microsystems
Volume
21
Issue
5
fYear
2004
Firstpage
448
Lastpage
449
Abstract
Book Reviewed: Digital Logic Testing and Simulation, 2nd edition, by Alexander Miczo (Wiley-Interscience, 2003, ISBN 0-471-43995-9, 696 pp., $115).
Keywords
Automatic test pattern generation; Books; Built-in self-test; Computational modeling; Computer simulation; Delay; Logic testing; Sections; Sun; Test pattern generators;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2004.44
Filename
1341385
Link To Document