Title :
In situ characterization of laser diodes from wide-band electrical noise measurements
Author :
Andrekson, P.A. ; Andersson, P. ; Alping, A. ; Eng, S.T.
Author_Institution :
Chalmers University of Technology, Gothenburg, Sweden
fDate :
7/1/1986 12:00:00 AM
Abstract :
The wide-band electrical noise characteristics of 0.8-, 1.3-, and 1.5-μm laser diodes have been studied theoretically and for the first time also experimentally. The electrical noise is related to the optical intensity noise behavior, and can therefore be used for in situ measurements and characterization of laser diodes. Since the measurements are performed without any optical components, undesired optical feedback is eliminated. The results show that several important laser parameters and characteristics can be extracted from purely electrical noise measurements. Among these are the relaxation frequency, the threshold current, the emission linewidth, optical feedback properties, and longitudinal mode hopping behavior. Good agreement between the noise theory and the electrical noise measurements has been obtained. An expression for obtaining both the spectral linewidth and lineshape from electrical noise measurements is also derived.
Keywords :
Laser measurements; Laser noise; Measurement noise; Noise measurement; Semiconductor lasers; Diode lasers; Electric variables measurement; Laser feedback; Laser modes; Noise measurement; Optical devices; Optical feedback; Optical noise; Performance evaluation; Wideband;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.1986.1074803