• DocumentCode
    1128617
  • Title

    Analysis of Gable-Roofed Building Signature in Multiaspect InSAR Data

  • Author

    Thiele, A. ; Cadario, E. ; Schulz, K. ; Soergel, U.

  • Author_Institution
    FGAN-FOM Res. Inst. for Optronics & Pattern Recognition, Ettlingen, Germany
  • Volume
    7
  • Issue
    1
  • fYear
    2010
  • Firstpage
    83
  • Lastpage
    87
  • Abstract
    The spatial resolution of state-of-the-art synthetic aperture radar sensors enables the structure analysis of urban areas. The appearance of buildings in magnitude images in settlements is dominated by the effects of the inherent oblique scene illumination. In urban residential districts, salient pairs of parallel lines of bright magnitude are often caused by direct reflection and double-bounce signal at gable-roofed buildings. In this letter, the magnitude and interferometric phase signature of gable-roofed buildings are discussed to extract reliable building features for reconstruction. The analysis contains signature changes by varying illumination and building geometry. The presented approach is aiming at the reconstruction of gable-roofed buildings by a knowledge-based analysis considering the discussed effects. The reconstruction results are assessed by using a high-resolution LIDAR surface model as ground truth.
  • Keywords
    building; feature extraction; geophysical image processing; image reconstruction; lighting; radar interferometry; remote sensing by radar; synthetic aperture radar; building geometry; feature extraction; gable-roofed building signature; high-resolution LIDAR surface model; image reconstruction; interferometric phase signature; knowledge-based analysis; multiaspect InSAR data; oblique scene illumination; spatial resolution; synthetic aperture radar sensors; urban area structure analysis; urban residential districts; Gable-roofed building reconstruction; high resolution; interferometric synthetic aperture radar (SAR) (InSAR); multiaspect;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2009.2023476
  • Filename
    5159508