Title :
Optical Nonlinear Phase Noise Compensation for
-Gbaud PolDM-16 QAM Transmission Using a Code-Aided Expectation-Maximization Algorithm
Author :
Chunpo Pan ; Bulow, Henning ; Idler, Wilfried ; Schmalen, Laurent ; Kschischang, Frank R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
Abstract :
Nonlinearity-induced phase noise has become a major obstacle in long-haul coherent fiber-optic communication systems. Such phase noise has been shown to be signal dependent, and correlated over time. We propose a code-aided expectation-maximization algorithm to mitigate such nonlinear phase noise, iteratively utilizing both the time correlation of the nonlinearity-induced impairments and a soft-decision error-control code. Simulation and experimental results show that on a dual-polarization wavelength-division-multiplexed 16 QAM system, launch-power tolerance can be increased by 1.5 dB, and the optical signal-to-noise ratio requirement can be relaxed by 0.3 dB to achieve the same Q2-factor.
Keywords :
code division multiplexing; expectation-maximisation algorithm; light coherence; nonlinear optics; optical communication equipment; optical fibre filters; optical fibre polarisation; optical fibre testing; optical noise; phase noise; quadrature amplitude modulation; wavelength division multiplexing; Q2-factor; code-aided expectation-maximization algorithm; dual-polarization wavelength-division-multiplexed 16 QAM system; launch-power tolerance; long-haul coherent fiber-optic communication systems; optical nonlinear phase noise compensation; optical signal-to-noise ratio; soft-decision error-control code; Correlation; Nonlinear optics; Parity check codes; Phase noise; Quadrature amplitude modulation; Wavelength division multiplexing; Communication system nonlinearities; Optical fiber communication; communication system nonlinearities; digital filters; equalizers; error correction coding; error-correction coding; optical fiber communication; phase noise;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2015.2451108