• DocumentCode
    1130652
  • Title

    Wavelength dependent characteristics of high-speed metamorphic photodiodes

  • Author

    Jang, J.H. ; Cueva, G. ; Sankaralingam, R. ; Fay, P. ; Hoke, W.E. ; Adesida, I.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • Volume
    15
  • Issue
    2
  • fYear
    2003
  • Firstpage
    281
  • Lastpage
    283
  • Abstract
    Double-heterojunction photodiodes based on GaAs metamorphic growth technology are described. The effect of the large bandgap InAlAs layer incorporated in the device heterostructure was examined by measuring wavelength dependent responsivities and bandwidths at 0.85-, 1.33-, and 1.55-μm illumination. The photodiodes exhibited 0.4 A/W responsivity and over 50-GHz bandwidth for 1.55-μm laser illumination. The bias voltage required to achieve the maximum bandwidth was measured to be less than -1 V.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; high-speed optical techniques; indium compounds; leakage currents; photodiodes; 0.85 micron; 1.33 micron; 1.55 micron; 50 GHz; A/W responsivity; GaAs; GaAs metamorphic growth technology; InAlAs-InGaAs-GaAs; bias voltage; double-heterojunction photodiodes; high-speed metamorphic photodiodes; large bandgap InAlAs layer; low-leakage current; wavelength dependent characteristics; wavelength dependent responsivities; Anodes; Bandwidth; Contact resistance; Gallium arsenide; Lighting; Optoelectronic devices; Photodiodes; Photonic band gap; Radio frequency; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2002.806886
  • Filename
    1174146