Title :
Silicon pin detector with integrated JFET-based source follower
Author :
Pancheri, L. ; Marzocca, C. ; Boscardin, M. ; Betta, G. F Dalla
Author_Institution :
Univ. of Trento, Povo Di Trento, Italy
Abstract :
A pin photodiode monolithically integrated with a bias resistor and a JFET-based source follower is presented. Results from static and dynamic characterisation of the structure are reported, together with SPICE simulations used to design an optimised device which can be fabricated in the same technology. This structure can be employed as a pixel in linear X-ray scanners for non-destructive inspection.
Keywords :
JFET integrated circuits; SPICE; X-ray apparatus; elemental semiconductors; integrated optoelectronics; p-i-n photodiodes; photodetectors; preamplifiers; resistors; silicon; SPICE; Si; bias resistor; dynamic characterisation; integrated JFET-based source follower; linear X-ray scanners; monolithically integrated p-i-n photodiode; nondestructive inspection; optimised device design; silicon p-i-n detector; static characterisation;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20046137
