• DocumentCode
    1131978
  • Title

    Low-Voltage Organic Field-Effect Transistor With PMMA/  \\hbox {ZrO}_{2} Bilayer Dielectric

  • Author

    Shang, Liwei ; Liu, Ming ; Tu, Deyu ; Liu, Ge ; Liu, Xinghua ; Ji, Zhuoyu

  • Author_Institution
    Key Lab. of Nanofabrication & Novel Devices Integration Technol., Chinese Acad. of Sci., Beijing
  • Volume
    56
  • Issue
    3
  • fYear
    2009
  • fDate
    3/1/2009 12:00:00 AM
  • Firstpage
    370
  • Lastpage
    376
  • Abstract
    This paper reports on the application of a bilayer polymethylmethacrylate (PMMA)/ZrO2 dielectric in copper ph-thalocyanine (CuPc) organic field-effect transistors (OFETs). By depositing a PMMA layer on ZrO2, the leakage of the dielectric is reduced by one order of magnitude compared to single- layer ZrO2. A high-quality interface is obtained between the organic semiconductor and the combined insulators. By integrating the advantages of polymer and high-fe dielectrics, the device achieves both high mobility and low threshold voltage. The typical field-effect mobility, threshold voltage, on/off current ratio, and subthreshold slope of OFETs with bilayer dielectric are 5.6 times 10-2 cm2/V ldr s, 0.8 V, 1.2 times 103, and 2.1 V/dec, respectively. By using the bilayer dielectrics, the hysteresis observed in the devices with single-layer ZrO2 is no longer present.
  • Keywords
    dielectric materials; low-power electronics; organic field effect transistors; polymers; zirconium compounds; PMMA; ZrO2; bilayer polymethylmethacrylate; high quality interface; low voltage organic field effect transistor; organic field effect transistors; organic semiconductor; Crystalline materials; Dielectric materials; Dielectrics and electrical insulation; High K dielectric materials; High-K gate dielectrics; OFETs; Organic semiconductors; Polymers; Semiconductor materials; Threshold voltage; Dielectric films; leakage currents; thin-film devices; threshold logic devices; voltage control;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2008.2011576
  • Filename
    4768692