DocumentCode :
1132413
Title :
Large-Signal Diode Modeling—An Alternative Parameter-Extraction Technique
Author :
Liew, Yew Hui ; Joe, Jurianto
Author_Institution :
Singapore Design Center, Motorola, Singapore
Volume :
53
Issue :
8
fYear :
2005
Firstpage :
2633
Lastpage :
2638
Abstract :
An alternative numerical optimization method of large-signal equivalent-circuit diode modeling using dc and small-signal S -parameter measurements is described. In general, there are two ways to extract the equivalent-circuit parameters to model a nonlinear device such as a diode. They are based on numerical optimization or noniterative analytical procedure. The former is usually better in approximating the device response. Nevertheless, it requires arbitrary selection of a voltage-dependent S -parameter set to obtain the voltage-independent parameters. In this alternative numerical optimization method, an arbitrary selection of a voltage-dependent S -parameter set to obtain the voltage-independent parameters is not required. Validation of this parameter-extraction technique is done via modeling a forward-biased tunnel diode and a reverse-biased varactor diode. The models are further verified by implementing them in designing and developing an oscillator and a voltage-controlled oscillator.
Keywords :
S-parameters; equivalent circuits; optimisation; semiconductor device models; tunnel diodes; S-parameter measurement; equivalent-circuit diode modeling; equivalent-circuit parameters; forward-biased tunnel diode; large-signal diode modeling; noniterative analytical procedure; nonlinear device; numerical optimization method; parameter-extraction technique; reverse-biased varactor diode; voltage-controlled oscillator; Current measurement; Diodes; Equivalent circuits; Frequency measurement; Optimization methods; Packaging; Particle measurements; Varactors; Voltage; Voltage-controlled oscillators; Diodes; modeling; oscillators; tunnel diodes; varactors; voltage-controlled oscillators (VCOs);
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2005.852747
Filename :
1492666
Link To Document :
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