DocumentCode :
1132533
Title :
Analysis of Electric Field Averaging for In Situ Radiofrequency Exposure Assessment
Author :
Larchêveque, Emmanuel ; Dale, Christian ; Wong, Man-Faï ; Wiart, Joe
Author_Institution :
France Telecom R&D, Issy-les-Moulineaux, France
Volume :
54
Issue :
4
fYear :
2005
fDate :
7/1/2005 12:00:00 AM
Firstpage :
1245
Lastpage :
1250
Abstract :
The impact of small-scale fading on the estimation of local average power density for radiofrequency exposure assessment is studied in the case of a Rayleigh fading, a Rician- k fading, and a Nakagami- m fading. In all cases, it is shown that the significant parameter is the coefficient of variation of power density. We give the relation between the error on the estimation of local average power density and the number of independent points that are used in the averaging process. We apply this analysis to a distribution of fading statistical properties provided by measurements.
Keywords :
Rayleigh channels; Rician channels; cellular radio; electric fields; statistical analysis; Nakagami-m fading; Rayleigh fading; Rician-k fading; cellular radio; electric field averaging; fading statistical properties; local average power density estimation; situ radiofrequency exposure assessment; small-scale fading; Base stations; Diffraction; Electromagnetic measurements; Fading; Magnetic field measurement; Narrowband; Performance evaluation; Protection; Radio frequency; Rayleigh channels; Electromagnetic field exposure; local average power; small-scale fading;
fLanguage :
English
Journal_Title :
Vehicular Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9545
Type :
jour
DOI :
10.1109/TVT.2005.851334
Filename :
1492677
Link To Document :
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