DocumentCode :
1135403
Title :
Parameter de-embedding accuracy dependency upon material sample dimensions
Author :
Park, A. ; Dominek, Allen
Author_Institution :
Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
Volume :
40
Issue :
8
fYear :
1992
fDate :
8/1/1992 12:00:00 AM
Firstpage :
1674
Lastpage :
1680
Abstract :
The sensitivity of the sample fit in rectangular waveguide fixtures is examined for constitutive parameter de-embedding. The sensitivity is characterized through a percent error figure between the de-embedded and known parameter values when an air gap exists between the sample and the side walls of the fixture. The de-embedding process assumed a completely filled waveguide in which rigorously calculated S parameters for material sample air gaps in either the E- or H-plane walls of the waveguide were used. The presence of an air gap was very noticeable for a E-plane gap. Commonly used gap correction factors provided limited improvement in reducing air gap related errors
Keywords :
S-parameters; dielectric-loaded waveguides; rectangular waveguides; E-plane gap; H-plane walls; S parameters; air gap; completely filled waveguide; de-embedding accuracy dependency; gap correction factors; material sample dimensions; parameter values; rectangular waveguide fixtures; side walls; Air gaps; Error correction; Fixtures; Moment methods; Planar waveguides; Rectangular waveguides; Reflection; Temperature; Transmission lines; Waveguide discontinuities;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.149547
Filename :
149547
Link To Document :
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