Title :
On Necessary and Sufficient Conditions for Multiple Fault Undetectability
Author_Institution :
University of Wisconsin-Madison
Abstract :
This correspondence states necessary and sufficient conditions for a multiple stuck-at fault in a combinational network to be undetected by a test set. The conditions are given in terms of fault masking relationships. It is shown that several other statements on this subject which have appeared in the literature are invalid.
Keywords :
Fault detection; fault masking; multiple fault test sets; multiple faults; Boolean functions; Circuit faults; Combinational circuits; Fault detection; Logic devices; Mathematics; Network synthesis; Sufficient conditions; Testing; Fault detection; fault masking; multiple fault test sets; multiple faults;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1979.1675251
