• DocumentCode
    1139698
  • Title

    Resonant-cavity enhanced (RCE) separate absorption and multiplication (SAM) avalanche photodetector (APD)

  • Author

    Murtaza, S.S. ; Anselm, K.A. ; Hu, C. ; Nie, H. ; Streetman, B.G. ; Campbell, J.C.

  • Author_Institution
    Microelectron. Res. Center, Texas Univ., Austin, TX, USA
  • Volume
    7
  • Issue
    12
  • fYear
    1995
  • Firstpage
    1486
  • Lastpage
    1488
  • Abstract
    We report a highly-efficient and wavelength-selective separate absorption and multiplication (SAM) avalanche photodiode (APD) with a thin (500 /spl Aring/) absorbing layer. The improved characteristics of the photodetector were obtained by placing the absorption and multiplication layers in a Fabry-Perot cavity. An external quantum efficiency of 77% was achieved with a spectral linewidth of less than 4 nm and an avalanche gain of more than 50. Noise measurements indicate that the impact ionization coefficient for electrons is larger than that for holes.
  • Keywords
    Fabry-Perot resonators; avalanche photodiodes; impact ionisation; light absorption; noise measurement; optical films; optical noise; optical resonators; photodetectors; spectral line breadth; 500 A; 77 percent; Fabry-Perot cavity; RCE SAM avalanche photodetector; absorption layers; external quantum efficiency; highly-efficient; impact ionization coefficient; multiplication layers; noise measurements; resonant-cavity enhanced separate absorption and multiplication avalanche photodetector; spectral linewidth; thin absorbing layer; wavelength-selective; Absorption; Fabry-Perot; Frequency; Mirrors; Optical receivers; Optical sensors; Photodetectors; Photodiodes; Resonance; Temperature;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.477291
  • Filename
    477291