Verification of magnetized electron series resonance from 1-D plasma diode noise current

Author

Qiu, W. ; Birdsall, C.K.

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA

Volume

30

Issue

5

fYear

2002

fDate

10/1/2002 12:00:00 AM

Firstpage

2035

Lastpage

2041

Abstract

A plasma diode appears resistive to an external observer at the magnetized electron series resonance (MESR). The authors derive the MESR resonant frequencies from an equivalent circuit model using linear cold plasma theory. The noise current from a decaying plasma is predicted to exhibit the MESR resonant frequencies and is verified by observing the spectra of the noise currents in 1d3v simulations. The spectra compare well with the theoretical values, which depend on the (central) plasma density and the sheath thickness. The latter is obtained from the (warm) plasma simulations.

Keywords

noise; plasma diodes; plasma simulation; plasma transport processes; 1-D plasma diode noise current; 1d3v simulations; decaying plasma; equivalent circuit model; linear cold plasma theory; magnetized electron series resonance; magnetized plasma; noise current; noise currents; plasma density; resonant frequencies; sheath thickness; warm plasma simulations; Circuit noise; Diodes; Electrons; Equivalent circuits; Magnetic resonance; Plasma density; Plasma sheaths; Plasma simulation; Predictive models; Resonant frequency;

fLanguage

English

Journal_Title

Plasma Science, IEEE Transactions on

Publisher

ieee

ISSN

0093-3813

Type

jour

DOI

10.1109/TPS.2002.805324

Filename

1178021