DocumentCode :
1141147
Title :
Resistive Switching Characteristics of Sol–Gel Zinc Oxide Films for Flexible Memory Applications
Author :
Kim, Sungho ; Moon, Hanul ; Gupta, Dipti ; Yoo, Seunghyup ; Choi, Yang-Kyu
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon
Volume :
56
Issue :
4
fYear :
2009
fDate :
4/1/2009 12:00:00 AM
Firstpage :
696
Lastpage :
699
Abstract :
Unipolar resistive switching devices are investigated for nonvolatile memory applications in a metal-insulator-metal structure in which the insulator layer is based on sol-gel-derived zinc oxide (ZnO) films prepared by a simple spin-coating process followed by thermal annealing. Fast programming ( les 50 ns) and a high off-to-on resistance ratio ( ges 104) is demonstrated. The influences on the switching behaviors according to the crystallinity of the ZnO films are studied as a function of the annealing temperature. In addition, the devices are fabricated on a flexible plastic substrate and exhibit excellent durability upon repeated bending tests, demonstrating their potential for flexible low-cost memory devices.
Keywords :
MIM structures; annealing; random-access storage; sol-gel processing; spin coating; annealing temperature; durability; film crystallinity; flexible low-cost memory devices; flexible plastic substrate; metal-insulator-metal structure; nonvolatile memory; off-to-on resistance ratio; repeated bending tests; resistance random access memory; sol-gel films; spin-coating process; thermal annealing; unipolar resistive switching devices; Annealing; Crystallization; Insulation; Metal-insulator structures; Nonvolatile memory; Plastics; Temperature; Testing; Thermal resistance; Zinc oxide; Flexible; resistance random access memory (RRAM); resistive switching; sol–gel; zinc oxide (ZnO);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2009.2012522
Filename :
4773260
Link To Document :
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