Title :
Noise constrained transistor sizing and power optimization for dual V/sub t/ domino logic
Author :
Jung, Seong-Ook ; Kim, Ki-Wook ; Kang, Sung-Mo Steve
Author_Institution :
T-RAM Inc., San Jose, CA, USA
Abstract :
Dynamic logic is susceptible to noise, especially in the ultra-deep submicrometer dual threshold voltage technology. When the dual threshold voltage is applied to the domino logic, noise immunity must be carefully considered since the significant subthreshold current of the low threshold voltage transistor makes the dynamic node much more susceptible to noise. In the first part of this paper, we introduce a new keeper transistor sizing method to determine the optimal keeper transistor size in terms of speed, power, and noise immunity. With the use of data obtained by presimulation, it is unnecessary to simulate all the design corners corresponding to the feasible NMOS evaluation transistor size ranges to find the optimal keeper transistor size. HSPICE simulation results show that the proposed keeper transistor sizing method can be broadly applied to all the domino logic gates. In the second part of this paper, we propose a new dual threshold voltage domino logic synthesis with the keeper transistor sizing to minimize the power consumption while meeting delay and noise constraints. With the optimal keeper transistor size determined by the proposed keeper transistor sizing method, the dual threshold voltage assignment to domino logic can be simplified to the discrete threshold voltage selection. Experimental results for ISCAS85 benchmark circuits show significant savings on leakage power and active power.
Keywords :
CMOS logic circuits; VLSI; circuit CAD; circuit optimisation; delays; integrated circuit design; integrated circuit noise; logic CAD; logic gates; low-power electronics; HSPICE simulation; NMOS evaluation transistor size ranges; delay constraints; design corners; discrete threshold voltage selection; domino logic gates; dual V/sub t/ domino logic; dual threshold voltage domino logic synthesis; dual threshold voltage technology; keeper transistor sizing method; low threshold voltage transistor; noise constrained transistor sizing; noise immunity; optimal keeper transistor size; power optimization; subthreshold current; ultra deep submicron technology; ultradeep submicrometer technology; CMOS logic circuits; Circuit noise; Circuit synthesis; Constraint optimization; Crosstalk; Energy consumption; Logic design; Logic gates; Subthreshold current; Threshold voltage;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2002.801625