A configurable integrated test methodology for monolithic microwave integrated circuit production

Author

Wang, Huei ; Yang, Daniel C. ; Esfandiari, Reza ; Joseph, Thomas ; Ellis, Robert K. ; Ng, Gary

Author_Institution

TRW, Redondo Beach, CA, USA

Volume

5

Issue

3

fYear

1992

fDate

8/1/1992 12:00:00 AM

Firstpage

248

Lastpage

254

Abstract

A configurable integrated test (CIT) model has been developed for GaAs monolithic microwave integrated circuit (MMIC) production control. The optimal process/test strategy for an MMIC in production phase can easily by predicted from this model. The adaptive nature of the CIT model also suggests suitability of the screen criteria and quantifies the necessity of each test step. Application of this CIT method of MMIC manufacturing will result in significant cost reductions. The CIT theory and application examples are presented

Keywords

MMIC; integrated circuit manufacture; integrated circuit testing; production control; production testing; CIT model; GaAs; MMIC manufacturing; adaptive nature; configurable integrated test methodology; monolithic microwave integrated circuit production; production control; screen criteria; Circuit testing; Gallium arsenide; Integrated circuit modeling; Integrated circuit testing; MMICs; Microwave integrated circuits; Microwave theory and techniques; Monolithic integrated circuits; Predictive models; Production control;

fLanguage

English

Journal_Title

Semiconductor Manufacturing, IEEE Transactions on

Publisher

ieee

ISSN

0894-6507

Type

jour

DOI

10.1109/66.149816

Filename

149816