Title :
A configurable integrated test methodology for monolithic microwave integrated circuit production
Author :
Wang, Huei ; Yang, Daniel C. ; Esfandiari, Reza ; Joseph, Thomas ; Ellis, Robert K. ; Ng, Gary
Author_Institution :
TRW, Redondo Beach, CA, USA
fDate :
8/1/1992 12:00:00 AM
Abstract :
A configurable integrated test (CIT) model has been developed for GaAs monolithic microwave integrated circuit (MMIC) production control. The optimal process/test strategy for an MMIC in production phase can easily by predicted from this model. The adaptive nature of the CIT model also suggests suitability of the screen criteria and quantifies the necessity of each test step. Application of this CIT method of MMIC manufacturing will result in significant cost reductions. The CIT theory and application examples are presented
Keywords :
MMIC; integrated circuit manufacture; integrated circuit testing; production control; production testing; CIT model; GaAs; MMIC manufacturing; adaptive nature; configurable integrated test methodology; monolithic microwave integrated circuit production; production control; screen criteria; Circuit testing; Gallium arsenide; Integrated circuit modeling; Integrated circuit testing; MMICs; Microwave integrated circuits; Microwave theory and techniques; Monolithic integrated circuits; Predictive models; Production control;
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
