Title :
Diagnosability of t-connected networks and product networks under the comparison diagnosis model
Author :
Chang, Chien-Ping ; Lai, Pao-Lien ; Tan, Jimmy Jiann-Mean ; Hsu, Lih-Hsing
Author_Institution :
Dept. of Electr. Eng., Chung Cheng Inst. of Technol., Taoyuan, Taiwan
Abstract :
Diagnosability is an important factor in measuring the reliability of an interconnection network, while the (node) connectivity is used to measure the fault tolerance of an interconnection network. We observe that there is a close relationship between the connectivity and the diagnosability. According to our results, a t-regular and t-connected network with at least 2t + 3 nodes is t-diagnosable. Furthermore, the diagnosability of the product networks is also investigated in this work. The product networks, including hypercube, mesh, and tori, comprise very important classes of interconnection networks. Herein, different combinations of t-diagnosable and t-connected are employed to study the diagnosability of the product networks.
Keywords :
fault diagnosis; fault tolerant computing; graph theory; multiprocessor interconnection networks; fault diagnosis; fault tolerance; interconnection network reliability; order graph; product networks; t-connected network diagnosability; Fault diagnosis; Fault tolerance; Hypercubes; Information science; Maintenance; Multiprocessor interconnection networks; Network topology; Routing; System analysis and design; 65; Index Terms- Diagnosability; comparison diagnosis model; connectivity; order graph; product networks.; t-diagnosable;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.2004.114