DocumentCode :
1143158
Title :
Packaging of Surface Micromachined Thin Film Thermocouples (TFT): Comparison of the Resistance Arc Microwelding Technique With Wire Bonding
Author :
Sinha, Nipun ; Ahn, Hee Seok ; Williams, Randall ; Banerjee, Debjyoti
Author_Institution :
Mech. Eng. Dept., Univ. of Pennsylvania, Philadelphia, PA, USA
Volume :
32
Issue :
2
fYear :
2009
fDate :
6/1/2009 12:00:00 AM
Firstpage :
252
Lastpage :
260
Abstract :
In this paper, we report the packaging of thin film thermocouples (TFT) using resistance arc welding technique. Parallel gap welding and spot welding have been reported in the literature for attaching thin wires to metal thin films. To the knowledge of the authors, this is the first time resistance arc welding has been reported as a packaging technique for microfabricated devices. A brief description of the microfabrication process and chemical analysis using X-ray photoelectron spectroscopy (XPS) of the vapor deposited alloy constituents for the TFT are reported in this study. K-type (chromel and alumel) thermocouple wires were used as targets for physical vapor deposition of the component layers of the TFT. The calibration of the TFT using high-speed data acquisition is reported. The calibration curves of TFT packaged using ultrasonic wire bonding of Al wires are compared with TFT packaged using resistance arc welding of K-type thermocouple wires. TFT packaged using resistance arc welding is found to have better temperature response under steady-state conditions.
Keywords :
X-ray photoelectron spectra; arc welding; electronics packaging; lead bonding; micromachining; resistance welding; thermocouples; thin film devices; ultrasonic bonding; K-type thermocouple wires; X-ray photoelectron spectroscopy; calibration; chemical analysis; microfabrication; packaging; physical vapor deposition; resistance arc microwelding; surface micromachining; thin film thermocouples; ultrasonic wire bonding; Bonding; Calibration; Chemical analysis; Joining processes; Packaging; Spot welding; Surface resistance; Thermal resistance; Thin film transistors; Wire; Interconnects; X-ray photoelectron spectroscopy (XPS); resistance arc welding; thin film thermocouples (TFTs); wire bonding;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2009.2013982
Filename :
5169990
Link To Document :
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