Title :
Errata to "Comparison of charge yield in MOS devices for different radiation sources"
Author :
Paillet, P. ; Schwank, James R. ; Shaneyfelt, Marty R. ; Ferlet-Cavrois, Veronique ; Jones, R.L. ; Flament, O. ; Blackmore, Ewart W.
Author_Institution :
CEA/DIF
Abstract :
In the above-named article [ibid., vol. 49, pp. 2656??2661, Dec. 2002], an editorial processing error ocurred in the reproduction of Figs. 1 and 2. The correctly processed versions are given.
Keywords :
Laboratories; MOS devices; MOSFETs; Protons;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2003.809324
