مرکز منطقه ای اطلاع رساني علوم و فناوري - Special issue on nonvolatile memory reliability

DocumentCode :

1143961

Title :

Special issue on nonvolatile memory reliability

Volume :

Issue :

fYear :

2004

Firstpage :

749

Lastpage :

749

Abstract :

Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers.

fLanguage :

English

Journal_Title :

Electron Device Letters, IEEE

Publisher :

ieee

ISSN :

0741-3106

Type :

jour

DOI :

10.1109/LED.2004.838921

Filename :

1347217

Link To Document :