Title :
On the use of error propagation for statistical validation of computer vision software
Author :
Liu, Xufei ; Kanungo, Tapas ; Haralick, Robert M.
Author_Institution :
Cisco Syst., Parsippany, NJ, USA
Abstract :
Computer vision software is complex, involving many tens of thousands of lines of code. Coding mistakes are not uncommon. When the vision algorithms are run on controlled data which meet all the algorithm assumptions, the results are often statistically predictable. This renders it possible to statistically validate the computer vision software and its associated theoretical derivations. In this paper, we review the general theory for some relevant kinds of statistical testing and then illustrate this experimental methodology to validate our building parameter estimation software. This software estimates the 3D positions of buildings vertices based on the input data obtained from multi-image photogrammetric resection calculations and 3D geometric information relating some of the points, lines and planes of the buildings to each other.
Keywords :
computer vision; parameter estimation; program verification; software engineering; statistical testing; 3D geometric information; buildings vertices; computer vision software; error propagation; multi-image photogrammetric resection calculations; parameter estimation software; statistical testing; statistical validation; Computer errors; Computer vision; Image databases; Parameter estimation; Software algorithms; Software engineering; Software testing; Spatial databases; Statistical analysis; Uncertainty; 3D parameter estimation; Index Terms- Statistical analysis; error propagation; multivariate hypothesis testing; software engineering.; software validation; Algorithms; Artificial Intelligence; Computer Simulation; Data Interpretation, Statistical; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Models, Statistical; Pattern Recognition, Automated; Software; Software Validation;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2005.203