Title :
An Information Theoretic Approach to Digital Fault Testing
Author :
Agrawal, Vishwani D.
Author_Institution :
Bell Laboratories
Abstract :
The concepts of information theory are applied to the problem of testing digital circuits. By analyzing the information throughput of the circuit an expression for the probability of detecting a hardware fault is derived. Examples are given to illustrate an application of the present study in designing efficient pattern generators for testing.
Keywords :
Logic testing; statistical communication theory; statistical testing; test generation; Circuit analysis; Circuit faults; Circuit testing; Digital circuits; Electrical fault detection; Fault detection; Hardware; Information analysis; Information theory; Throughput; Logic testing; statistical communication theory; statistical testing; test generation;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1981.1675843
