DocumentCode
11449
Title
Ultralow Power Circuit Design With Subthreshold/Near-Threshold 3-D IC Technologies
Author
Samal, Sandeep Kumar ; Yarui Peng ; Pathak, Mohit ; Sung Kyu Lim
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume
5
Issue
7
fYear
2015
fDate
Jul-15
Firstpage
980
Lastpage
990
Abstract
The requirement of ultralow power and energy efficient systems is becoming more and more important with the increase in the use of miniaturized portable devices and unsupervised remote sensor systems. 3-D integration is an emerging technology that helps in reducing footprint as well as power. In this paper, we study in detail the combined benefits of 3-D ICs and low-voltage supply designs to obtain maximum energy efficiency. We implement different types of circuits in conventional 2-D and through-silicon-via-based 3-D designs at different supply voltages varying from nominal to subthreshold voltages. The impact of 3-D integration on these different types of circuits is analyzed. Our study is based on power and energy comparison of full GDSII layouts. Our study confirms that subthreshold/near-threshold circuits indeed offer a few orders of magnitude power versus performance tradeoff with further improvement due to 3-D implementation. In addition, 3-D designs reduce the footprint area up to 78% and wirelength up to 33% compared with the 2-D counterpart for individual design benchmarks. Our studies also show that thermal and IR drop issues are negligible in subthreshold 3-D implementation due to its extreme low-power operation. Finally, we demonstrate the low-power and high-memory bandwidth advantages of many-core 3-D subthreshold circuits.
Keywords
integrated circuit layout; low-power electronics; three-dimensional integrated circuits; 2D integrated circuit design; full GDSII layout; low voltage supply designs; maximum energy efficiency; near-threshold 3D IC technology; power versus performance trade-off; subthreshold 3D IC technology; thermal effect; through silicon via based 3D design; ultralow power circuit design; voltage drop issues; Integrated circuits; Inverters; Logic gates; Random access memory; Standards; Threshold voltage; Transistors; 3-D IC; subthreshold/near-threshold operation; through-silicon via (TSV); ultralow power; ultralow power.;
fLanguage
English
Journal_Title
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
2156-3950
Type
jour
DOI
10.1109/TCPMT.2015.2441066
Filename
7156066
Link To Document