• DocumentCode
    1145352
  • Title

    A 66-333-MHz 12-mW register-controlled DLL with a single delay line and adaptive-duty-cycle clock dividers for production DDR SDRAMs

  • Author

    Jeon, Young-Jin ; Lee, Joong-Ho ; Lee, Hyun-Chul ; Jin, Kyo-Won ; Min, Kyeong-Sik ; Chung, Jin-Yong ; Park, Hong-June

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., Kyungbuk, South Korea
  • Volume
    39
  • Issue
    11
  • fYear
    2004
  • Firstpage
    2087
  • Lastpage
    2092
  • Abstract
    The conventional register-controlled delay locked loop (RCDLL) with a single delay line requires a complex logic circuit following the phase comparator to prevent the false lock. A RCDLL with two delay lines was published to reduce the chip area and power consumption by comparing the frequency-divided slow signals. Further reductions of 20% in both chip area and power consumptions were achieved in the RCDLL proposed in this work by using a single delay line. The duty cycle of the clock divider output was adaptively changed between 25% and 50% according to the external clock frequency to minimize the number of delay elements and hence the jitter of DLL output clock. The adaptive-change of duty cycle reduced the peak-to-peak jitter of data output from 800 ps to 400 ps at the data rate of 266 Mb/s in the production 256-Mb DDR SDRAM. The worst-case power consumption and the chip size of the RCDLL chip fabricated by using a 0.15-μm CMOS technology were measured to be 12-mW and 0.16-mm2, respectively, at the data rate of 400 Mb/s and the supply voltage of 2.5 V.
  • Keywords
    CMOS memory circuits; DRAM chips; clocks; comparators (circuits); delay lines; delay lock loops; dividing circuits; integrated circuit design; 0.15 micron; 12 mW; 2.5 V; 256 Mbyte; 400 Mbit/s; 66 to 333 MHz; CMOS technology; DDR SDRAM; adaptive-duty-cycle clock dividers; clock divider; clock frequency; delay elements; false lock; frequency-divided slow signals; logic circuit; phase comparator; register-controlled delay locked loop; single delay line; CMOS technology; Clocks; DRAM chips; Delay lines; Energy consumption; Frequency conversion; Jitter; Logic circuits; Power measurement; Production;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2004.835809
  • Filename
    1347344