• DocumentCode
    1148588
  • Title

    Channel temperature measurement of PHEMT by means of optical probes

  • Author

    Savian, D. ; Carlo, A. Di ; Lugli, P. ; Peroni, M. ; Cetronio, C. ; Lanzieri, C. ; Meneghesso, G. ; Zanoni, E.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Rome, Roma, Italy
  • Volume
    39
  • Issue
    2
  • fYear
    2003
  • fDate
    1/23/2003 12:00:00 AM
  • Firstpage
    247
  • Lastpage
    248
  • Abstract
    A novel technique for precise temperature measurement of high power PHEMTs is presented. The method, based on the measurement of photogenerated current, is used to extract the temperature of the PHEMT channel. Evaluation of thermal resistance is presented.
  • Keywords
    photoconductivity; power HEMT; probes; semiconductor device measurement; temperature measurement; thermal resistance; channel temperature measurement; high power PHEMT; optical probe; photocurrent spectra; thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20030135
  • Filename
    1179547
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1148588