• DocumentCode
    11495
  • Title

    The Comparison of (Ag,Cu)(In,Ga)Se _{\\bf 2} and Cu(In,Ga)Se _{\\bf 2} Thin Films Deposited by Th

  • Author

    Lei Chen ; Jinwoo Lee ; Shafarman, W.N.

  • Author_Institution
    Dept. of Phys. & Astron., Univ. of Delaware, Newark, DE, USA
  • Volume
    4
  • Issue
    1
  • fYear
    2014
  • fDate
    Jan. 2014
  • Firstpage
    447
  • Lastpage
    451
  • Abstract
    (Ag,Cu)(In,Ga)Se2 and Cu(In,Ga)Se2 thin-films with bandgap ~1.35 eV were deposited by a three-stage elemental coevaporation process. The depositions were conducted at substrate temperatures of 580 °C and 650 °C to understand the effects of Ag alloying and high growth temperature on material properties. Ag/(Ag+Cu) and Ga/(In+Ga) gradients were observed and were reduced with higher growth temperature. Grain size was quantified and found to be enhanced by Ag and high growth temperature, while film texture showed no significant change with different deposition conditions.
  • Keywords
    alloying; copper alloys; evaporation; gallium alloys; grain size; indium alloys; selenium alloys; semiconductor growth; semiconductor thin films; silver alloys; ternary semiconductors; (AgCu)(InGa)Se2; Ag alloying effects; Cu(InGa)Se2; bandgap; film texture; grain size; high growth temperature; material properties; temperature 580 degC; temperature 650 degC; thin film deposition; three-stage elemental coevaporation; Diffraction; Films; Gallium; Grain size; Photonic band gap; Temperature; X-ray diffraction; (Ag,Cu)(In,Ga)Se$_{2}$; Ga gradient; grain size; texture; three-stage deposition;
  • fLanguage
    English
  • Journal_Title
    Photovoltaics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    2156-3381
  • Type

    jour

  • DOI
    10.1109/JPHOTOV.2013.2280471
  • Filename
    6600988