DocumentCode :
1149894
Title :
Photoexcited resonance-enhanced nitrogen-trap GaAs1-xPx:N laser
Author :
Holonyak, Nick, Jr. ; Dupuis, Russell D. ; Macksey, H. ; Zack, Gregory W. ; Craford, M. George ; Finn, Donald
Author_Institution :
University of Illinois, Urbana, IL, USA
Volume :
9
Issue :
2
fYear :
1973
fDate :
2/1/1973 12:00:00 AM
Firstpage :
379
Lastpage :
383
Abstract :
Data (77 K) on x = 0.41 and x = 0.46 N-doped GaAS1-xPxare presented showing that the electron-hole recombination probability may be resonantly enhanced when the crystal composition is varied and the \\Gamma conduction band minimum is made degenerate, or nearly degenerate, with the A -line N isoelectronic trap state ( E_{\\Gamma } \\approx E_{N} \\sim 2.0 eV, x \\approx 0.40 ). Data on x = 0.46 GaAs1-xPx:N suggest that resonant enhancement occurs in a "turning" range |E_{\\Gamma } - E_{N}| \\leq 55 meV. A consequence of this work is that photopumped GaAs1-xPx:N ( x = 0.46 ) exhibits laser operation at the unusually high photon energy of 2.032 eV (6100 Å, orange). The idea of resonance-enhanced recombination and the results now demonstrated in GaAs1-xPx:N are general enough to be applicable also to p-n junctions.
Keywords :
Doping; Electron traps; Erbium; Gallium arsenide; Laser transitions; P-n junctions; Photoelectricity; Resonance; Spontaneous emission; Stimulated emission;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1973.1077464
Filename :
1077464
Link To Document :
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