Title :
Verification Testing—A Pseudoexhaustive Test Technique
Author :
McCluskey, Edward J.
Author_Institution :
Center for Reliable Computing, Computer Systems Laboratory, Stanford University
fDate :
6/1/1984 12:00:00 AM
Abstract :
A new approach to test pattern generation which is particularly suitable for self-test is described. Required computation time is much less than for present day automatic test pattern generation (ATPG) programs. Fault simulation or fault modeling is not required. More patterns may be obtained than from standard ATPG programs. However, fault coverage is much higher—all irredundant multiple as well as single stuck faults are detected. The test patterns are easily generated algorithmically either by program or hardware.
Keywords :
Autonomous test; built-in self-test; pseudoexhaustive test; test pattern generation; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Computational modeling; Computer networks; Costs; Fault detection; Military computing; Test pattern generators; Autonomous test; built-in self-test; pseudoexhaustive test; test pattern generation;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1984.1676477
