DocumentCode :
1151626
Title :
Impact of a vertical Φ-shape transistor (VΦT) cell for 1 Gbit DRAM and beyond
Author :
Maeda, Shigenobu ; Maegawa, Shigeto ; Ipposhi, Takashi ; Nishimura, Hideki ; Kuriyama, H. ; Tanina, O. ; Inoue, Yasuyuki ; Nishimura, T.
Author_Institution :
ULSI Lab., Mitsubishi Electr. Corp., Itami, Japan
Volume :
42
Issue :
12
fYear :
1995
fDate :
12/1/1995 12:00:00 AM
Firstpage :
2117
Lastpage :
2123
Abstract :
We propose a vertical Φ-shape transistor (VΦT) cell for 1 Gbit DRAM and beyond. The VΦT is a vertical MOSFET whose gate surrounds its channel region like a Greek-alphabetic letter Φ, fabricated through the penetration of the gate electrode (=word line) which has been formed beforehand, and the formation of the channel plug inside the penetrating hole. The VΦT provides the 4F2 cell. The substantial simplicity of the VΦT process contributes to the reduction in the number of process steps. The above two features result in the drastic reduction in total chip cost. Moreover, we demonstrate that the advantages on electrical properties of the VΦT become more prominent with proceeding of scaling down. We have indicated that the VΦT is a promising candidate for the gigabit DRAM in terms of size, cost, and performance
Keywords :
CMOS memory circuits; DRAM chips; MOSFET; silicon-on-insulator; 1 Gbit; 4F2 cell; Si; channel plug; gigabit DRAM; vertical Φ-shape transistor cell; vertical MOSFET; Capacitors; Costs; DRAM chips; Electrodes; Helium; MOSFET circuits; Plugs; Random access memory; Tides; Ultra large scale integration;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.477769
Filename :
477769
Link To Document :
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